freescale semiconductor addendum MC9S08EL32AD rev. 1, 12/2011 contents ? freescale semiconductor, inc., 2011. all rights reserved. 1 clarifications for revision 3 . . . . . . . . . . . . . . . . . . . . . . . 2 2 addendum for revision 3 . . . . . . . . . . . . . . . . . . . . . . . . 2 3 revision history. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 this addendum document descri bes clarifications to the mc9s08el32 series data sheet (document number: mc9s08el32). for convenience, the addenda items are grouped by revision. addendum to mc9s08el32 series data sheet clarifications for mc9s08el32/16 and mc9s08sl16/8
addendum to mc9s08el32 seri es data sheet, rev. 1 2 freescale semiconductor 1 clarifications for revision 3 the following specifications apply to the mc9s08el32/16 and mc9s08sl16/8. 2 addendum for revision 3 3 revision history table 2 provides a revision history for this document. c characteristic symbol v dd (v) typ max unit p 1 1 stop currents are tested in production for 25c on all parts. te sts at other temperatures depe nd upon the part number suffix and maturity of the product. freescale may eliminate a test in sertion at a particular temper ature from the production test flow once sufficient data has been collected and is approved. stop3 mode supply current 125 c (m suffix only) s3i dd 5 3 60 55 110 105 ? a p 1 stop2 mode supply current 125 c (m suffix only) s2i dd 5 3 50 45 100 95 ? a table 1. mc9s08el32 datasheet revision 3 errata location description section ?slic during break interrupts? remove section ?slic during break interrupts? on mc9s08el32 data sheet.this functionality does not exist on the 9s08el/sl family. table 2. MC9S08EL32AD revision history rev. number substantive changes date of release 1 remove section ? slic during break interrupts? in mc9s08el32 data sheet. 12/2011
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